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Scanning Electron Microscope
SEM is an advanced imaging technique which enables the high level assessment of minute details in addition to chemical analysis of discrete areas of interest. This method of inspection allows for the examination of small samples while retaining overall high definition images and a greater depth of field compared with conventional optical microscopy alone.
SEM has a wide range of commercial applications including forensic engineering, contaminant/debris analysis, research projects and product development.
Although Brookes Bell are always available to analyse samples and carry out testing on the behalf of our clients, the JEOL IT200 SEM unit located within our Wirral based Laboratory and Technology Centre is also available for use on a self-drive basis. We offer a programme of training and support to enable customers to drive and operate the equipment on their own samples. This includes single use, one off plans or annual block booking contracts. This can be of benefit to both large scale industrial firms as part of their own root cause analysis, start-up companies for research and development and as overspill for academia.
Our SEM includes secondary electron and back-scattered imaging modes and is fitted with an Energy-Dispersive X-ray (EDX) unit for chemical analysis. If you require any further details or would like to book a session, please contact email@example.com.